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LiU has expanded its materials research infrastructure with the installation of a cutting-edge Focused Ion Beam system (FIB). This state-of-the-art instrument is dedicated to high-quality TEM and APT sample preparation.

X-ray Photoelectron Spectroscopy (XPS) is a technique used to study the surface chemistry of materials. However, in an article LiU researchers University point out a problem with referencing standards.