Einar Sveinbjörnsson

Jordan R. Nicholls, Arnar M. Vidarsson, Daniel Haasmann, Einar Sveinbjörnsson, Sima Dimitrijev (2021) A method for characterizing near-interface traps in SiC metal-oxide-semiconductor capacitors from conductance-temperature spectroscopy measurements Journal of Applied Physics , Vol. 129

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Jordan R. Nicholls, Arnar M. Vidarsson, Daniel Haasmann, Einar Sveinbjörnsson, Sima Dimitrijev (2020) Near-Interface Trap Model for the Low Temperature Conductance Signal in SiC MOS Capacitors With Nitrided Gate Oxides IEEE Transactions on Electron Devices , Vol. 67 , s. 3722-3728

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Rabia Y. Khosa, J. T. Chen, K. Pálsson, Robin Karhu, Jawad Hassan, Niklas Rorsman, Einar Ö. Sveinbjörnsson (2019) Electrical Characterization of MOCVD Grown Single Crystalline AlN Thin Films on 4H-SiC Silicon Carbide and Related Materials 2018 , s. 460-464

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Anna Malmros, Jr-Tai Chen, Hans Hjelmgren, Jun Lu, Lars Hultman, Olof Kordina, Einar Sveinbjörnsson, Herbert Zirath, Niklas Rorsman (2019) Enhanced Mobility in InAlN/AlN/GaN HEMTs Using a GaN Interlayer IEEE Transactions on Electron Devices , Vol. 66 , s. 2910-2915

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R. Y. Khosa, Jr-Tai Chen, M. Winters, K. Palsson, Robin Karhu, Jawad Ul-Hassan, N. Rorsman, Einar Sveinbjörnsson (2019) Electrical characterization of high k-dielectrics for 4H-SiC MIS devices Materials Science in Semiconductor Processing , Vol. 98 , s. 55-58

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Einar Sveinbjörnsson

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Einar Sveinbjörnsson

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