Einar Sveinbjörnsson

Publications

2023

Misagh Ghezellou, Piyush Kumar, Marianne E. Bathen, Robert Karsthof, Einar Sveinbjörnsson, Ulrike Grossner, Peder Bergman, Lasse Vines, Jawad ul-Hassan (2023) The role of boron related defects in limiting charge carrier lifetime in 4H-SiC epitaxial layers APL Materials, Vol. 11, Article 031107 (Article in journal) https://dx.doi.org/10.1063/5.0142415

Arnar M. Vidarsson, Axel R. Persson, Jr-Tai Chen, Daniel Haasmann, Jawad Ul-Hassan, Sima Dimitrijev, Niklas Rorsman, Vanya Darakchieva, Einar Sveinbjörnsson (2023) Observations of very fast electron traps at SiC/high-κ dielectric interfaces APL Materials, Vol. 11, Article 111121 (Article in journal) https://dx.doi.org/10.1063/5.0160287

Arnar M. Vidarsson, Daniel Haasmann, Sima Dimitrijev, Einar Sveinbjörnsson (2023) Improvement of channel-carrier mobility in 4H-SiC MOSFETs correlated with passivation of very fast interface traps using sodium enhanced oxidation AIP Advances, Vol. 13, Article 055126 (Article in journal) https://dx.doi.org/10.1063/5.0151589

2022

Arnar M. Vidarsson, Jordan R. Nicholls, Daniel Haasmann, Sima Dimitrijev, Einar Sveinbjörnsson (2022) Detection of near-interface traps in NO annealed 4H-SiC metal oxide semiconductor capacitors combining different electrical characterization methods Journal of Applied Physics, Vol. 131, Article 215702 (Article in journal) https://dx.doi.org/10.1063/5.0086974

Alexis Papamichail, Anelia Kakanakova-Gueorguieva, Einar Sveinbjörnsson, Axel Persson, B. Hult, N. Rorsman, Vallery Stanishev, Son Phuong Le, Per O A Persson, M. Nawaz, Jr-Tai Chen, Plamen Paskov, Vanya Darakchieva (2022) Mg-doping and free-hole properties of hot-wall MOCVD GaN Journal of Applied Physics, Vol. 131, Article 185704 (Article in journal) https://dx.doi.org/10.1063/5.0089406