Einar Sveinbjörnsson

Publications

2023

Misagh Ghezellou, Piyush Kumar, Marianne E. Bathen, Robert Karsthof, Einar Sveinbjörnsson, Ulrike Grossner, Peder Bergman, Lasse Vines, Jawad ul-Hassan (2023) The role of boron related defects in limiting charge carrier lifetime in 4H-SiC epitaxial layers APL Materials, Vol. 11, Article 031107 Continue to DOI

Arnar M. Vidarsson, Axel R. Persson, Jr-Tai Chen, Daniel Haasmann, Jawad Ul-Hassan, Sima Dimitrijev, Niklas Rorsman, Vanya Darakchieva, Einar Sveinbjörnsson (2023) Observations of very fast electron traps at SiC/high-κ dielectric interfaces APL Materials, Vol. 11, Article 111121 Continue to DOI

Arnar M. Vidarsson, Daniel Haasmann, Sima Dimitrijev, Einar Sveinbjörnsson (2023) Improvement of channel-carrier mobility in 4H-SiC MOSFETs correlated with passivation of very fast interface traps using sodium enhanced oxidation AIP Advances, Vol. 13, Article 055126 Continue to DOI

2022

Arnar M. Vidarsson, Jordan R. Nicholls, Daniel Haasmann, Sima Dimitrijev, Einar Sveinbjörnsson (2022) Detection of near-interface traps in NO annealed 4H-SiC metal oxide semiconductor capacitors combining different electrical characterization methods Journal of Applied Physics, Vol. 131, Article 215702 Continue to DOI

Alexis Papamichail, Anelia Kakanakova-Gueorguieva, Einar Sveinbjörnsson, Axel Persson, B. Hult, N. Rorsman, Vallery Stanishev, Son Phuong Le, Per O A Persson, M. Nawaz, Jr-Tai Chen, Plamen Paskov, Vanya Darakchieva (2022) Mg-doping and free-hole properties of hot-wall MOCVD GaN Journal of Applied Physics, Vol. 131, Article 185704 Continue to DOI