Einar Sveinbjörnsson
Adjunct Professor
Publications Show/Hide content
Jordan R. Nicholls, Arnar M. Vidarsson, Daniel Haasmann, Einar Sveinbjörnsson, Sima Dimitrijev
(2021)
A method for characterizing near-interface traps in SiC metal-oxide-semiconductor capacitors from conductance-temperature spectroscopy measurements
Journal of Applied Physics
, Vol. 129
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Jordan R. Nicholls, Arnar M. Vidarsson, Daniel Haasmann, Einar Sveinbjörnsson, Sima Dimitrijev
(2020)
Near-Interface Trap Model for the Low Temperature Conductance Signal in SiC MOS Capacitors With Nitrided Gate Oxides
IEEE Transactions on Electron Devices
, Vol. 67
, s. 3722-3728
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Rabia Y. Khosa, J. T. Chen, K. Pálsson, Robin Karhu, Jawad Hassan, Niklas Rorsman, Einar Ö. Sveinbjörnsson
(2019)
Electrical Characterization of MOCVD Grown Single Crystalline AlN Thin Films on 4H-SiC
Silicon Carbide and Related Materials 2018
, s. 460-464
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Anna Malmros, Jr-Tai Chen, Hans Hjelmgren, Jun Lu, Lars Hultman, Olof Kordina, Einar Sveinbjörnsson, Herbert Zirath, Niklas Rorsman
(2019)
Enhanced Mobility in InAlN/AlN/GaN HEMTs Using a GaN Interlayer
IEEE Transactions on Electron Devices
, Vol. 66
, s. 2910-2915
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R. Y. Khosa, Jr-Tai Chen, M. Winters, K. Palsson, Robin Karhu, Jawad Ul-Hassan, N. Rorsman, Einar Sveinbjörnsson
(2019)
Electrical characterization of high k-dielectrics for 4H-SiC MIS devices
Materials Science in Semiconductor Processing
, Vol. 98
, s. 55-58
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