Einar Sveinbjörnsson

Rabia Y. Khosa, J. T. Chen, K. Pálsson, Robin Karhu, Jawad Hassan, Niklas Rorsman, Einar Ö. Sveinbjörnsson (2019) Electrical Characterization of MOCVD Grown Single Crystalline AlN Thin Films on 4H-SiC Silicon Carbide and Related Materials 2018 , s. 460-464

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Anna Malmros, Jr-Tai Chen, Hans Hjelmgren, Jun Lu, Lars Hultman, Olof Kordina, Einar Sveinbjörnsson, Herbert Zirath, Niklas Rorsman (2019) Enhanced Mobility in InAlN/AlN/GaN HEMTs Using a GaN Interlayer IEEE Transactions on Electron Devices , Vol. 66 , s. 2910-2915

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R. Y. Khosa, Jr-Tai Chen, M. Winters, K. Palsson, Robin Karhu, Jawad Ul-Hassan, N. Rorsman, Einar Sveinbjörnsson (2019) Electrical characterization of high k-dielectrics for 4H-SiC MIS devices Materials Science in Semiconductor Processing , Vol. 98 , s. 55-58

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Robin Karhu, Einar Sveinbjörnsson, Bjorn Magnusson, Ivan Gueorguiev Ivanov, Örjan Danielsson, Jawad Ul-Hassan (2019) CVD growth and properties of on-axis vanadium doped semi-insulating 4H-SiC epilayers Journal of Applied Physics , Vol. 125

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R. Y. Khosa, Jr-Tai Chen, K. Pålsson, Robin Karhu, Jawad Ul-Hassan, N. Rorsman, Einar Sveinbjörnsson (2019) Electrical properties of 4H-SiC MIS capacitors with AlN gate dielectric grown by MOCVD Solid-State Electronics , Vol. 153 , s. 52-58

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Einar Sveinbjörnsson

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Einar Sveinbjörnsson

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