Einar Sveinbjörnsson
Adjungerad professor
Publikationer
2023
The role of boron related defects in limiting charge carrier lifetime in 4H-SiC epitaxial layers
APL Materials, Vol. 11, Artikel 031107
(Artikel i tidskrift)
https://dx.doi.org/10.1063/5.0142415
Observations of very fast electron traps at SiC/high-κ dielectric interfaces
APL Materials, Vol. 11, Artikel 111121
(Artikel i tidskrift)
https://dx.doi.org/10.1063/5.0160287
Improvement of channel-carrier mobility in 4H-SiC MOSFETs correlated with passivation of very fast interface traps using sodium enhanced oxidation
AIP Advances, Vol. 13, Artikel 055126
(Artikel i tidskrift)
https://dx.doi.org/10.1063/5.0151589
2022
Detection of near-interface traps in NO annealed 4H-SiC metal oxide semiconductor capacitors combining different electrical characterization methods
Journal of Applied Physics, Vol. 131, Artikel 215702
(Artikel i tidskrift)
https://dx.doi.org/10.1063/5.0086974
Mg-doping and free-hole properties of hot-wall MOCVD GaN
Journal of Applied Physics, Vol. 131, Artikel 185704
(Artikel i tidskrift)
https://dx.doi.org/10.1063/5.0089406