Einar Sveinbjörnsson

Jordan R. Nicholls, Arnar M. Vidarsson, Daniel Haasmann, Einar Sveinbjörnsson, Sima Dimitrijev (2021) A method for characterizing near-interface traps in SiC metal-oxide-semiconductor capacitors from conductance-temperature spectroscopy measurements Journal of Applied Physics , Vol. 129

Vidare till DOI

Jordan R. Nicholls, Arnar M. Vidarsson, Daniel Haasmann, Einar Sveinbjörnsson, Sima Dimitrijev (2020) Near-Interface Trap Model for the Low Temperature Conductance Signal in SiC MOS Capacitors With Nitrided Gate Oxides IEEE Transactions on Electron Devices , Vol. 67 , s. 3722-3728

Vidare till DOI

Rabia Y. Khosa, J. T. Chen, K. Pálsson, Robin Karhu, Jawad Hassan, Niklas Rorsman, Einar Ö. Sveinbjörnsson (2019) Electrical Characterization of MOCVD Grown Single Crystalline AlN Thin Films on 4H-SiC Silicon Carbide and Related Materials 2018 , s. 460-464

Vidare till DOI

Anna Malmros, Jr-Tai Chen, Hans Hjelmgren, Jun Lu, Lars Hultman, Olof Kordina, Einar Sveinbjörnsson, Herbert Zirath, Niklas Rorsman (2019) Enhanced Mobility in InAlN/AlN/GaN HEMTs Using a GaN Interlayer IEEE Transactions on Electron Devices , Vol. 66 , s. 2910-2915

Vidare till DOI

R. Y. Khosa, Jr-Tai Chen, M. Winters, K. Palsson, Robin Karhu, Jawad Ul-Hassan, N. Rorsman, Einar Sveinbjörnsson (2019) Electrical characterization of high k-dielectrics for 4H-SiC MIS devices Materials Science in Semiconductor Processing , Vol. 98 , s. 55-58

Vidare till DOI

Einar Sveinbjörnsson

Presentation

PublikationerVisa/dölj innehåll

2021

2020

2019

Taggar Visa/dölj innehåll

Einar Sveinbjörnsson

PublikationerVisa/dölj innehåll

2021

2020

2019

Taggar Visa/dölj innehåll

Dela på