naugh16

Naureen Ghafoor

Associate Professor, Docent

Universitetslektor

Presentation

Postdoctoral scholarship in Thin Film Physics

Apply to Postdoc scholarship granted by Carl Tryggers Stiftelse (600 000 SEK) for studying "Stress-free Diaphragms for Long-lasting Inner Ear Implants" in Nanomaterials Science Unit with Thin Film Physics Division at IFM with Dr. Naureen Ghafoor. Find more information here Postdoctoral scholarship in Thin Film Physics.

Publications

2024

Samira Dorri, Justinas Palisaitis, Szilárd Kolozsvári, Peter Polcik, Per Persson, Naureen Ghafoor, Fredrik Eriksson, Jens Birch (2024) TiB1.8 single layers and epitaxial TiB2-based superlattices by magnetron sputtering using a TiB (Ti:B = 1:1) target Surface & Coatings Technology, Vol. 494, Article 131534 (Article in journal) Continue to DOI
Anton Zubayer, Naureen Ghafoor, K. A. Thorarinsdottir, A. Glavic, J. Stahn, G. Nagy, A. Vorobiev, F. Magnus, Jens Birch, Fredrik Eriksson (2024) Increased neutron reflectivity and polarization of neutron-optical engineered Fe/11B4CTi multilayer optics Physical Review B, Vol. 110, Article 155408 (Article in journal) Continue to DOI
Marcus Lorentzon, Michael Meindlhumer, Justinas Palisaitis, Grzegorz Greczynski, Jozef Keckes, Johanna Rosén, Lars Hultman, Jens Birch, Naureen Ghafoor (2024) Toughness enhancement in TiN/Zr 0.37 Al 0.63 N 1.09 multilayer films Acta Materialia, Vol. 273, Article 119979 (Article in journal) Continue to DOI
Sjoerd Stendahl, Naureen Ghafoor, Anton Zubayer, Marcus Lorentzon, Alexei Vorobiev, Jens Birch, Fredrik Eriksson (2024) Material design optimization for large-m 11B4C-based Ni/Ti supermirror neutron optics Materials & design, Vol. 243, Article 113061 (Article in journal) Continue to DOI
Sjoerd Stendahl, Naureen Ghafoor, Matthias Schwartzkopf, Anton Zubayer, Jens Birch, Fredrik Eriksson (2024) Morphology of Buried Interfaces in Ion-Assisted Magnetron Sputter-Deposited 11B4C-Containing Ni/Ti Multilayer Neutron Optics Investigated by Grazing-Incidence Small-Angle Scattering ACS Applied Materials and Interfaces, Vol. 16, p. 22665-22675 (Article in journal) Continue to DOI

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