2023 Daria Kalustova, Vasyl Kornaga, Andrii Rybalochka, Yingjie Yu, Sergiy Valyukh (2023) Color temperature tunable RGBW cluster with optimize color rendering and efficacy Optical Engineering: The Journal of SPIE, Vol. 62 Continue to DOI 2022 Alina Pranovich, Abigail Trujillo Vazquez, Daniel Nyström, Sergiy Valyukh, Jeppe Revall Frisvad, Susanne Klein, Carinna Parraman (2022) Angular dependent reflectance spectroscopy of RGBW pigments Dingfu Chen, Zhijun Yin, Zhu Chen, Sergiy Valyukh, Yingjie Yu (2022) Stitching interferometry of cylindrical surface Optics and lasers in engineering, Vol. 157 Continue to DOI D. O. Kalustova, V. I Kornaga, A. V Rybalochka, Sergiy Valyukh (2022) RGBW lighting systems: Influence of the white LED Semiconductor Physics, Quantum Electronics & Optoelectronics, Vol. 25, p. 76-82 Continue to DOI Lin Chang, Sergiy Valyukh, Tingting He, Yingjie Yu (2022) Multisurface Interferometric Algorithm and Error Analysis With Adaptive Phase Shift Matching IEEE Transactions on Instrumentation and Measurement, Vol. 71 Continue to DOI
Daria Kalustova, Vasyl Kornaga, Andrii Rybalochka, Yingjie Yu, Sergiy Valyukh (2023) Color temperature tunable RGBW cluster with optimize color rendering and efficacy Optical Engineering: The Journal of SPIE, Vol. 62 Continue to DOI
Alina Pranovich, Abigail Trujillo Vazquez, Daniel Nyström, Sergiy Valyukh, Jeppe Revall Frisvad, Susanne Klein, Carinna Parraman (2022) Angular dependent reflectance spectroscopy of RGBW pigments
Dingfu Chen, Zhijun Yin, Zhu Chen, Sergiy Valyukh, Yingjie Yu (2022) Stitching interferometry of cylindrical surface Optics and lasers in engineering, Vol. 157 Continue to DOI
D. O. Kalustova, V. I Kornaga, A. V Rybalochka, Sergiy Valyukh (2022) RGBW lighting systems: Influence of the white LED Semiconductor Physics, Quantum Electronics & Optoelectronics, Vol. 25, p. 76-82 Continue to DOI
Lin Chang, Sergiy Valyukh, Tingting He, Yingjie Yu (2022) Multisurface Interferometric Algorithm and Error Analysis With Adaptive Phase Shift Matching IEEE Transactions on Instrumentation and Measurement, Vol. 71 Continue to DOI