The Surface Physics Lab provides advanced instrumentation for preparation and characterization of thin films and powders.
Video

Description

The main characterization technique used in the lab is photoelectron spectroscopy (XPS & UPS). The technique is based on the photoelectric effect, where incident photons of known energy cause emission of electrons from the sample. The samples should preferably be conducting or semiconducting to avoid sample charging problems. In the laboratory, we also have equipment for preparation of thin film samples and devices both in the inert atmosphere (nitrogen) and vacuum. Currently we are also very active in the research of photovoltaic cells where we utilize our glovebox integrated solar simulator and advanced characterization setup.

Key features

  • Thin film characterization by means of XPS and UPS: elemental composition, chemical bonds, work function, valence band and energy level alignment
  • In situ doping of organic thin films
  • Preparation of thin film organic electronic devices in glovebox
  • Solar cell preparation and characterization with AAA class solar simulator
  • In situ optical absorption measurements in UV-VIS-IR region

Equipment & Resources

  • Photoelectron spectrometer Scienta, XPS (monochromatized source), UPS. 
    - equipped with dedicated vacuum chamber for sample preparation: sputter gun, e-beam metal source, Knudsen cell, alkali metal source, resistive heating
    - dedicated chamber for in situ optical characterization
    - flood gun for XPS on low conductivity samples
    * The preferred sample dimensions for the spectrometer is 1x1 cm to 2x2 cm

  • Photoelectron spectrometer Moses, XPS, UPS (monochromatized source)
    - equipped with dedicated vacuum chamber for sample preparation: sputter gun, e-beam metal source, Knudsen cell, alkali metal source 
    - additional cry-pumping available to maintain ultra-high vacuum during sample preparation
    * The preferred sample dimensions for the spectrometer is 1x1.5 cm

  • Kelvin Probe McCallister (possibility for measurements in vacuum and light assisted measurements)
  • Glovebox (Jacomex) - wet and dry section, equipped with integrated spincoater 
  • Metal and organic evaporator (Plassys Bestek) integrated with the glovebox (2 metal and 3 organic sources)
  • Glovebox integrated solar simulator (Enlitech) and Paios for characterization of diodes and solar cells
  • Optical absorption spectrometer UV VIS IR
  • Optical 3D profilometer:  Sensofar PLu neox