Photo of Grzegorz Greczynski

Grzegorz Greczynski

Professor, Head of Unit

Head of the Fundamental Science of Thin Films unit at the Department of Physics, Chemistry and Biology, LiU. Expert in high power impulse magnetron sputtering (HiPIMS) and X-ray Photoelectron Spectroscopy (XPS)

Presentation

My research interests are presently focused on low-energy ion/surface interactions (including both gas and metal ions) for nanostructure control during low-temperature growth of transition-metal-based nitride, boride, and carbide thin films by physical vapor deposition. In addition, I'm active in the field of X-ray photoelectron spectroscopy (XPS), with the aim to develop nondestructive analysis methods and to increase reliability of the technique.

I received my MSc degree in Materials Physics in 1997 from University of Science and Technology, Krakow, Poland as well as from Linköping University, Sweden.

In 2001 I obtained PhD in Materials Physics for the thesis “Photoelectron Spectroscopy Studies of Conjugated Polymer Surfaces and Interfaces for Organic-based Light Emitting Devices” under supervision of Prof. William R. Salaneck and the opponent was Prof. Hans Siegbahn.

Between 2001 and 2008 I worked in industry, first for Thin Film Electronics AB and later for Chemfilt Ionsputtering AB. The latter company pioneered the novel magnetron sputtering technique - high-power impulse magnetron sputtering (HiPIMS or HPPMS) which has become very popular in the recent years.

In 2009, I rejoined academia as an Assistant Professor of Thin Film Physics working with Professor Lars Hultman. My close collaborators are Professors Joe Greene and Ivan Petrov from University of Illinois (USA) and Professor Jochen Schneider from Aachen University (Germany).

In 2018 I was nominated Fellow of the American Vacuum Society for "seminal contributions to nondestructive XPS surface analysis, and the development of novel next-generation HiPIMS metal-ion deposition techniques".

Publications

2026

Grzegorz Greczynski (2026) Toward reliable x-ray photoelectron spectroscopy: Understanding fundamental differences between analyses performed on samples with and without electrical contact to spectrometer Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, Vol. 44, Article 023203 (Article in journal) Continue to DOI
Hanyan Wu, Yingxue An, Luigi Fabiano, Qifan Li, Qingqing Wang, Feng Zhang, Wenlong Jin, Miao Xiong, Junpeng Ji, Ugo Bruno, Grzegorz Greczynski, Grazia Maria Lucia Messina, Xianjie Liu, Chiyuan Yang, Simone Fabiano (2026) Ultrafast Vertical Organic Electrochemical Transistors With Ion-Permeable Conductive Polymer Top Electrodes Advanced Materials, Article PMID 9885358 (Article in journal) Continue to DOI
Shun Kashiwaya, Yuchen Shi, Jun Lu, Davide Sangiovanni, Grzegorz Greczynski, Martin Magnuson, Mike Andersson, Johanna Rosén, Lars Hultman (2026) Reply to: Synthesis of goldene comprising single-atom layer gold NATURE SYNTHESIS (Article in journal) Continue to DOI
Marcus Lorentzon, Naoki Takata, Diederik Depla, Tianqi Zhu, Grzegorz Greczynski, Rainer Hahn, Anton Zubayer, Justinas Palisaitis, Helmut Riedl, Dasom Kim, Lars Hultman, Jens Birch, Naureen Ghafoor (2026) Growth mechanisms and mechanical response of 3D superstructured cubic and hexagonal Hf1-xAlxN thin films Acta Materialia, Vol. 302, Article 121680 (Article in journal) Continue to DOI

2025

Sanjay Kumar, Bartosz Wicher, Grzegorz Greczynski (2025) Time-resolved ion mass spectrometry analysis reveal high Bi2+ and Bi3+ ion fluxes during high-power impulse magnetron sputtering of Bi target Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, Vol. 43, Article 063006 (Article in journal) Continue to DOI

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